- SIPIN
- Au,Ag,Pt,Pd,Cu,Zn,Ni,Cd,Ir,Re,W,Ru,Rh,Os,Fe,Mn,Cr,Co,Pb,In
- 5PPM
Gold Xray Gold Carat Meter Instrument,non-destructive Gold Purity Tester,spectral Gold Detector For Jewelry,jewelry Purity Analyzer Instrument,gold X-ray Carat Meter With Usb,customized Support For Spectral Gold Detector,x-ray Gold Purity Analyzer,non-destructive Spectral Gold Detector,spectral Gold Jewelry Analyzer , gold Purity Analyzer,spectral Gold Purity Tester
Product Description
I. Product
Introduction:
The ST-2640 spectrometer
is a precision testing device specifically designed for the gold recycling
industry. Equipped with a new Si-PIN detector, this product can quickly,
non-destructively, and accurately qualitatively and quantitatively analyze the
purity and composition of gold and its alloys, ensuring the accuracy of the
recycling process, preventing economic losses to recyclers due to misjudgment,
and improving the efficiency and profitability of the recycling process. It
also features a user-friendly interface, simplifying the testing process,
allowing even beginners to quickly get started. Its high-precision test results
provide reliable quality assurance for gold recyclers and also provide
transparent transaction data for both buyers and sellers.
Product Features:
1. Non-destructive
Testing: No pre-treatment of samples is required, enabling simple, convenient,
and fast non-destructive testing of precious metals.
2. Precise and
Fast: Stable results are obtained in tens of seconds, allowing for rapid
identification of precious metal composition and facilitating pricing and
trading of recycled gold.
3. High-Precision
Testing: XRF technology provides reliable purity and composition data,
accurately distinguishing between 99.99% and 99.9% gold.
4. Comprehensive
Safety Protection System: A high-frequency flashing yellow light reminds users
to avoid accidental opening of the cover; an automatic power-off protection
mechanism automatically cuts off high voltage upon opening; a continuous alarm
sounded if the cover is not fully closed when high voltage is applied; and a
fully enclosed metal casing eliminates the risk of leakage.
5. Sample
Flexibility: Easily measures samples of various shapes and small parts.
6. One-Button Test: "Place sample—Close cover—One-button test—View results"—simple operation, allowing even non-technical personnel to perform the test themselves.
7. Historical Spectrum Analysis: Supports opening historical and comparative spectra for analysis of sample spectra from different periods.
Technical Parameters :
|
Detector |
Si-Pin detector |
|
Multichannel Analyzer |
Digital multichannel |
|
Sample Form |
Solid, powder, liquid |
|
Measurement Time |
10sec～180sec(adjustable) |
|
Elemental Analysis Range |
18 elements including gold (Au), silver (Ag), copper (Cu), zinc (Zn), nickel (Ni), indium (In), cobalt (Co), palladium (Pd), platinum (Pt), rhenium (Re), tungsten (W), cadmium (Cd), rhodium (Rh), iron (Fe), lead (Pb), tin (Sn), manganese (Mn), chromium (Cr), etc. |
|
Analysis Range |
0.1%～99.99% |
|
Measurement Accuracy |
±0.05% |
|
Optical Tube Voltage |
0-50kV |
|
Optical Tube Current |
0uA-1000uA |
|
Camera |
High-definition camera |
|
Resolution |
175ev±5ev |
|
Collimator |
5mm |
|
Algorithm |
Integrates XRF analysis methods such as the calibration curve method and the basic parameter method (FP method) to eliminate background differences, reduce analysis errors, and improve detection accuracy |
|
Desktop PC |
I5 Dual-Core + Win10 |
|
Software Language |
Chinese/English (auto-switch) |
|
Ambient Temperature |
5～30℃ |
|
Relative Humidity |
≤85% |
|
Rated Power |
75W |
|
Power Supply Requirements |
AC 220V±5V/50Hz，no high-power electromagnetic or vibration interference sources nearby |
|
Sample Chamber Dimensions |
264mm*256mm*85mm |
|
External Dimensions |
370mm*368mm*335mm |
